Join us for an engaging discussion on the latest in polymeric applications and research. Following presentations from our guest speakers we will have live in-lab demonstrations of the techniques and modes featured.

Guest Speakers:

  • Gregory Meyers, Dow Chemical
  • Dr. Philippe Leclere, University of Mons
  • Bede Pittenger, Bruker

Symposium Topics

  • High-resolution electrical characterization with KPFM and TUNA provide insight into material performance and help to optimize organic photovoltaics and Li-ion batteries.
  • Applications of AFM in characterizing the mechanical properties and chemistry for development of new materials and troubleshooting production issues for the polymer materials industry.
  • Strengths and weaknesses of common AFM modes when applied to polymers and composites.
  • Practical considerations like probe selection and system calibration.


 Symposium Introduction by Session Chair | Dr. Thomas Mueller, Bruker

Atomic Force Microscopy in the Polymer Materials Industry| Dr. Gregory Meyers, The Dow Chemical Company

Nanoscale Electrical Characterization of Organic and Hybrid Materials for Energy Harvesting Applications| Prof. Philippe Leclere, University of Mons

A Selection of Modes and Methods for SPM Research of Polymers| Dr. Bede Pittenger, Bruker

Recent Developments with Live Demonstration | Dr. Senli Guo and Dr. Mickael Febvre, Bruker

  • Upcoming July 22nd
  • 8AM PDT / 11AM PDT / 5PM CEST



  • Bede Pittenger, Ph.D. – Bruker Nano Surfaces Sr. Staff Scientist, AFM Applications
  • Dr. Greg Meyers – Fellow, Core R&D – Analytical Science, The Dow Chemical Company, Midland, MI
  • Prof. Dr. Philippe LECLERE – Associate Professor, University of Mons