Join us for an engaging discussion on the latest in polymeric applications and research. Following presentations from our guest speakers we will have live in-lab demonstrations of the techniques and modes featured.
- Gregory Meyers, Dow Chemical
- Dr. Philippe Leclere, University of Mons
- Bede Pittenger, Bruker
- High-resolution electrical characterization with KPFM and TUNA provide insight into material performance and help to optimize organic photovoltaics and Li-ion batteries.
- Applications of AFM in characterizing the mechanical properties and chemistry for development of new materials and troubleshooting production issues for the polymer materials industry.
- Strengths and weaknesses of common AFM modes when applied to polymers and composites.
- Practical considerations like probe selection and system calibration.
Symposium Introduction by Session Chair | Dr. Thomas Mueller, Bruker
Atomic Force Microscopy in the Polymer Materials Industry| Dr. Gregory Meyers, The Dow Chemical Company
Nanoscale Electrical Characterization of Organic and Hybrid Materials for Energy Harvesting Applications| Prof. Philippe Leclere, University of Mons
A Selection of Modes and Methods for SPM Research of Polymers| Dr. Bede Pittenger, Bruker
Recent Developments with Live Demonstration | Dr. Senli Guo and Dr. Mickael Febvre, Bruker
- Upcoming July 22nd
- 8AM PDT / 11AM PDT / 5PM CEST
- Bede Pittenger, Ph.D. – Bruker Nano Surfaces Sr. Staff Scientist, AFM Applications
- Dr. Greg Meyers – Fellow, Core R&D – Analytical Science, The Dow Chemical Company, Midland, MI
- Prof. Dr. Philippe LECLERE – Associate Professor, University of Mons